|
@@ -2211,7 +2211,7 @@ namespace MeasureThread
|
|
|
//add by sun 2020-12-16 解决第5/6类样品 6000倍对焦不好问题
|
|
|
if ( m_measureFile.MParam.SampleName == "3")
|
|
|
{
|
|
|
- iSEM.SetReduced(402, 128, 500, 500);
|
|
|
+ iSEM.SetReduced(402, 128, 400, 256);
|
|
|
}else
|
|
|
{
|
|
|
iSEM.SetReduced(402, 128, 340, 256);
|
|
@@ -2702,16 +2702,19 @@ namespace MeasureThread
|
|
|
}
|
|
|
|
|
|
//14.自动控制FIB切割 del by sun 2020-12-15 temp
|
|
|
- //if (m_measureFile.MParam.Is_Photograph == false)
|
|
|
- //{
|
|
|
- // LogManager.AddHardwareLog("测量线程:第一个孔的测试过程-14.自动控制FIB切割开始!", true);
|
|
|
- // if (!FIBCross())
|
|
|
- // {
|
|
|
- // LogManager.AddHardwareLog("测量线程报错:自动控制FIB切割失败。", false);
|
|
|
- // return false;
|
|
|
- // }
|
|
|
- // LogManager.AddHardwareLog("测量线程:第一个孔的测试过程-14.自动控制FIB切割结束!", true);
|
|
|
- //}
|
|
|
+ if (m_measureFile.MParam.Is_Photograph == false)
|
|
|
+ {
|
|
|
+ if (m_measureFile.MParam.IsCutingForDebug)
|
|
|
+ {
|
|
|
+ LogManager.AddHardwareLog("测量线程:第一个孔的测试过程-14.自动控制FIB切割开始!=="+ m_measureFile.MParam.IsCutingForDebug, true);
|
|
|
+ if (!FIBCross())
|
|
|
+ {
|
|
|
+ LogManager.AddHardwareLog("测量线程报错:自动控制FIB切割失败。", false);
|
|
|
+ return false;
|
|
|
+ }
|
|
|
+ LogManager.AddHardwareLog("测量线程:第一个孔的测试过程-14.自动控制FIB切割结束!", true);
|
|
|
+ }
|
|
|
+ }
|
|
|
//del by sun 2020-12-15 temp end
|
|
|
//判断是否停止进程
|
|
|
if (key_stop)
|
|
@@ -6610,20 +6613,19 @@ namespace MeasureThread
|
|
|
/// <returns></returns>
|
|
|
public bool EDSAnalysis()
|
|
|
{
|
|
|
- //1.先降Z轴
|
|
|
+ //1.先降Z轴 37.241左右使工作距离从5mm 变为 10mm,这样方便能谱工作,麻烦是需要从新对焦。由于移动样品台会有误差,容易造成图像偏移,最好从新定位
|
|
|
if (m_measureFile.MParam.EDSZ < Z_Min || m_measureFile.MParam.EDSZ > Z_Max)
|
|
|
{
|
|
|
LogManager.AddHardwareLog("Z轴位置设置超出范围.", true);
|
|
|
+ return false;
|
|
|
}
|
|
|
LogManager.AddHardwareLog("将Z轴位置指定到:" + m_measureFile.MParam.EDSZ.ToString(), true);
|
|
|
- //if (!iSEM.SetStageGotoZ(m_measureFile.MParam.EDSZ))
|
|
|
- //{
|
|
|
- // LogManager.AddHardwareLog("测量线程报错:样品台Z回到安全位置失败", false);
|
|
|
- // return false;
|
|
|
- //}
|
|
|
- //设置WD add by sun 2020-12-16 能谱设置工作距离为10mm
|
|
|
- iSEM.SetWorkingDistance(m_measureFile.MParam.EDSZ);
|
|
|
- Thread.Sleep(1000);
|
|
|
+ if (!iSEM.SetStageGotoZ(m_measureFile.MParam.EDSZ))
|
|
|
+ {
|
|
|
+ LogManager.AddHardwareLog("测量线程报错:样品台Z回到安全位置失败", false);
|
|
|
+ return false;
|
|
|
+ }
|
|
|
+
|
|
|
|
|
|
while (true)
|
|
|
{
|
|
@@ -6633,6 +6635,8 @@ namespace MeasureThread
|
|
|
break;
|
|
|
}
|
|
|
}
|
|
|
+
|
|
|
+
|
|
|
//判断是否停止进程
|
|
|
if (key_stop)
|
|
|
{
|
|
@@ -6650,17 +6654,36 @@ namespace MeasureThread
|
|
|
iSEM.SetSEMIPROBE(m_measureFile.MParam.EDSA);
|
|
|
Thread.Sleep(500);
|
|
|
|
|
|
- //4.自动亮度对比度
|
|
|
- iSEM.SetAutoBright(100);
|
|
|
- Thread.Sleep(200);
|
|
|
- iSEM.SetAutoContrast(100);
|
|
|
- Thread.Sleep(200);
|
|
|
- if (!iSEM.SetAutoVideoBrightnessAndContrast())
|
|
|
+ //4.自动亮度对比度 del by sun 2020-12-17
|
|
|
+ //iSEM.SetAutoBright(100);
|
|
|
+ //Thread.Sleep(200);
|
|
|
+ //iSEM.SetAutoContrast(100);
|
|
|
+ //Thread.Sleep(200);
|
|
|
+ //if (!iSEM.SetAutoVideoBrightnessAndContrast())
|
|
|
+ //{
|
|
|
+ // LogManager.AddHardwareLog("测量线程报错:开始设置自动亮度、对比度失败。", false);
|
|
|
+ // return false;
|
|
|
+ //}
|
|
|
+ //Thread.Sleep(5000);
|
|
|
+ //del by sun 2020-12-17
|
|
|
+
|
|
|
+ //add by sun 2020-12-17 解决3大类样品FIB下亮度过白导致无法识别问题
|
|
|
+ //关闭自动亮度对比度
|
|
|
+ iSEM.SetAutoVideoOff();
|
|
|
+ Thread.Sleep(2000);
|
|
|
+ float m_TempBrightness = 50f;
|
|
|
+ float m_TempContrast = 29f;
|
|
|
+ if (m_measureFile.MParam.SampleName == "3")
|
|
|
{
|
|
|
- LogManager.AddHardwareLog("测量线程报错:开始设置自动亮度、对比度失败。", false);
|
|
|
- return false;
|
|
|
+ m_TempBrightness = 50f;
|
|
|
+ m_TempContrast = 29f;
|
|
|
}
|
|
|
+ iSEM.SetBrightness(m_TempBrightness); //50.0f
|
|
|
+ Thread.Sleep(200);
|
|
|
+ iSEM.SetContrast(m_TempContrast); //30.0f
|
|
|
Thread.Sleep(5000);
|
|
|
+ //add by sun 2020-12-17 解决3大类样品FIB下亮度过白导致无法识别问题 end
|
|
|
+
|
|
|
|
|
|
//5.自动对焦
|
|
|
iSEM.SetReduced(256, 192, 512, 512);
|